Advanced atomic force microscopy techniques II
نویسندگان
چکیده
منابع مشابه
Advanced atomic force microscopy techniques II
Surface science and nanotechnology are inherently coupled because of the increased surface-to-volume ratio at the nanometer scale. Most of the exciting and astonishing properties of nanoscale materials are related to certain surface reconstructions and nanoscale geometries. New functionality is achieved by combinations of nanoscale materials or by structuring their surfaces. The unrivaled tools...
متن کاملAdvanced atomic force microscopy techniques
Address: 1Department of Physics, University of Basel, Klingelbergstr. 82, 4056 Basel, Switzerland, 2Institute of Microstructure Technology (IMT), Karlsruhe Institute of Technology (KIT), Campus North, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein Leopoldshafen, Germany, 3Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), 76021 Karlsruhe, Germany, 4Department of Mechan...
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Atomic force microscopy (AFM) celebrates its 30th anniversary this year. It was presented by Binnig, Quate and Gerber in 1986 as an extension of the scanning tunneling microscope (STM) with the possibility to measure forces as small as 10−18 N [1]. Since then many different variations of the force detection method and various applications have appeared [2,3] and still the scientific community i...
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In order to visualize the atomic structure of materials in real space, a microscope with sub-nanometer resolution is needed. As such, breaking the resolution limit associated with the wavelength of visible light employed in traditional optical microscopy has been a long-standing dream of scientists around the world. This goal was finally reached in the early 1980s with the invention of the scan...
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Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...
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ژورنال
عنوان ژورنال: Beilstein Journal of Nanotechnology
سال: 2014
ISSN: 2190-4286
DOI: 10.3762/bjnano.5.241